Application of SKP for in situ monitoring of ion mobility along 
insulator/insulator interfaces

Rohwerder, Michael; Isik-Uppenkamp, Sonnur; Stratmann, Martin

doi:10.1016/j.electacta.2009.03.012

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Application of SKP for in situ monitoring of ion mobility along insulator/insulator interfaces

Rohwerder, M., Isik-Uppenkamp, S., & Stratmann, M. (2009). Application of SKP for in situ monitoring of ion mobility along insulator/insulator interfaces. Electrochimica Acta, 54(25), 6058-6062. doi:10.1016/j.electacta.2009.03.012.

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Creators:
Rohwerder, Michael¹, Author
Isik-Uppenkamp, Sonnur¹, Author
Stratmann, Martin², Author

Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360
2Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863348

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Language(s): eng - English

Dates: Date issued: 2009-10-30

Publication Status: Issued

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Identifiers: eDoc: 452343
DOI: 10.1016/j.electacta.2009.03.012

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Title: Electrochimica Acta

Abbreviation : Electrochim. Acta

Source Genre: Journal

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Publ. Info: Oxford, UK : Pergamon-Elsevier Science Ltd

Pages: - Volume / Issue: 54 (25) Sequence Number: - Start / End Page: 6058 - 6062 Identifier: ISSN: 0013-4686
CoNE: https://pure.mpg.de/cone/journals/resource/954925396434